Browsing by Author Short, K.T.

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Issue DateTitleAuthor(s)Citation
2009Microstructural investigation of nickel silicide thin films and the silicide–silicon interface using transmission electron microscopyMitchell, David; Bhaskaran, M; Holland, A.S.; Mitchell, A; Short, K.T.; Sriram, S; Electron MicroscopeMicrostructural investigation of nickel silicide thin films and the silicide–silicon interface using transmission electron microscopy, Micron, vol.40,(N/A),2009,pp 11-14