Browsing by Author Saxey, David

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Issue DateTitleAuthor(s)Citation
2012Analysis of dynamic segregation and crystallisation in Mg65Cu25Y10 bulk metallic glass using atom probe tomographyMarceau, Ross; Ringer, Simon; Saxey, David; Ferry, Michael; Gun, B; Laws, Kevin; McKenzie, Warren; Engineering Faculty Admin; Aerospace Mech & M'tronic Eng; Australian Centre for Microscopy and Microanalysis (ACMM)Analysis of dynamic segregation and crystallisation in Mg65Cu25Y10 bulk metallic glass using atom probe tomography, Materials Science and Engineering A: Structural Materials: Properties, Microstructures and Processing, vol.556, 30 October 2012, 2012,pp 558-566
2007Atom probe specimen fabrication methods using a dual FIB/SEMCairney, Julie; Honma, Tomoyuki; Ringer, Simon; Saxey, David; McGrouther, Damien; Electron Microscope; Electron Microscope; Electron Microscope; Electron MicroscopeAtom probe specimen fabrication methods using a dual FIB/SEM, Ultramicroscopy, vol.107,(9),2007,pp 756-760
2008Atom Probe Tomography at The University of SydneyCairney, Julie; Gault, Baptiste; Liddicoat, Peter Vincent; Liu, Zongwen; Marceau, Ross; Moody, Michael; Ringer, Simon; Saxey, David; Stephenson, Leigh; Zheng, Rongkun; Aerospace Mech & M'tronic Eng; Aerospace Mech & M'tronic Eng; Aerospace Mech & M'tronic Eng; Chemical & Biomolecular Engineering; Aerospace Mech & M'tronic Eng; Aerospace Mech & M'tronic Eng; Aerospace Mech & M'tronic Eng; Australian Centre for Microscopy and Microanalysis (ACMM); Aerospace Mech & M'tronic Eng; PhysicsAtom Probe Tomography at The University of Sydney in Frontiers in Materials Research (Advances in Materials Research 10), Springer, 2008, pp. 187-216
2006Characterization of Ni-base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy TechniquesRinger, Simon; Saxey, David; Zheng, Rongkun; Watanabe, Masashi; Williams, David B; Electron Microscope; Electron Microscope; Electron MicroscopeCharacterization of Ni-base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques, Microscopy and Microanalysis, vol.12,(Supplement 2),2006,pp 534-535
2009Microstructural evolution of spinodally formed Fe35Ni15Mn25Al25Kuwano, Satoko; Liu, Zongwen; Marceau, Ross; Prasad, Satya; Ringer, Simon; Saxey, David; Zheng, Rongkun; Baker, Ian; Loudis, Johnathan A.; Munroe, Paul R; Wittman, Markus W.; Key Centre - Microscopy; Key Centre - Microscopy; Key Centre - Microscopy; Electron Microscope; Electron Microscope; Electron Microscope; Electron MicroscopeMicrostructural evolution of spinodally formed Fe35Ni15Mn25Al25, Intermetallics, vol.17,(N/A),2009,pp 886-893
2005Nanonstructural Analysis of Advanced Alloys in a Local Electrode Atom ProbeMarceau, Ross; Ringer, Simon; Saxey, David; Zheng, Rongkun; Baker, Ian; Hanna, J; Key Centre - Microscopy; Electron Microscope; Electron Microscope; Electron MicroscopeNanonstructural Analysis of Advanced Alloys in a Local Electrode Atom Probe, Microscopy and Microanalysis, vol.11,(Supplement 2),2005,pp 872-873
2006Nanostructural Analysis of MaterialsApperley, Miles; Honma, Tomoyuki; Ringer, Simon; Saxey, David; Zheng, Rongkun; Electron Microscope; Electron Microscope; Electron Microscope; Electron Microscope; Electron MicroscopeNanostructural Analysis of Materials, Materials Forum, vol.30,(N/A),2006,pp 85-89
2006Preparation of Site Specific Atom Probe Tips using Focused Ion Beam TechnologyCairney, Julie; Marceau, Ross; Ringer, Simon; Saxey, David; McGrouther, Damien; McKenzie, Warren; Munroe, Paul; Electron Microscope; Key Centre - Microscopy; Electron Microscope; Electron MicroscopePreparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology, Microscopy and Microanalysis, vol.12,(Supplement 2),2006,pp 1296-1297
2007Recent advances in FIB-based site-specific atom probe specimen preparation techniquesCairney, Julie; Ringer, Simon; Saxey, David; McKenzie, Warren; Munroe, Paul; Electron Microscope; Electron Microscope; Electron MicroscopeRecent advances in FIB-based site-specific atom probe specimen preparation techniques, Microscopy and Microanalysis, vol.13,(Suppl 2),2007,pp 1634 CD-1635 CD
2007Site-specific specimen preparation for atom probe tomography of grain boundariesCairney, Julie; Ringer, Simon; Saxey, David; McGrouther, Damien; Electron Microscope; Electron Microscope; Electron MicroscopeSite-specific specimen preparation for atom probe tomography of grain boundaries, Physica B: Condensed Matter, vol.394,(2),2007,pp 267-269