Browsing by Author Petersen, Timothy

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Showing results 1 to 16 of 16
Issue DateTitleAuthor(s)Citation
2007Astigmatic intensity equation for electron microscopy based phase retrievalPetersen, Timothy; Keast, Vicki J.; Electron MicroscopeAstigmatic intensity equation for electron microscopy based phase retrieval, Ultramicroscopy, vol.107,(8),2007,pp 635-643
2011Atom probe trajectory mapping using experimental tip shape measurementsPetersen, Timothy; Ringer, Simon; Haley, Daniel; Smith, George D W; Australian Centre for Microscopy and Microanalysis (ACMM); Australian Centre for Microscopy and Microanalysis (ACMM)Atom probe trajectory mapping using experimental tip shape measurements, Journal of Microscopy, vol.244, 2, 2011,pp 170-180
2005Dark field microscopy for diffraction analysis of amorphous carbon solidsMcKenzie, David; Petersen, Timothy; Cockayne, David J.H.; McBride, W E; McCulloch, D G; Physics; Electron MicroscopeDark field microscopy for diffraction analysis of amorphous carbon solids, Journal of Non-Crystalline Solids, vol.351,(5),2005,pp 413-417
2010An electron tomography algorithm for reconstructing 3D morphology using surface tangents of projected scattering interfacesPetersen, Timothy; Ringer, Simon; Electron Microscope; Electron MicroscopeAn electron tomography algorithm for reconstructing 3D morphology using surface tangents of projected scattering interfaces, Computer Physics Communications, vol.181, 3,pp 676-682
2009Electron tomography using a geometric surface-tangent algorithm: Application to atom probe specimen morphologyPetersen, Timothy; Ringer, Simon; Electron Microscope; Electron MicroscopeElectron tomography using a geometric surface-tangent algorithm: Application to atom probe specimen morphology, Journal of Applied Physics, vol.105,(N/A),2009,pp 103518-1-103518-9
2008HRMC: Hybrid Reverse Monte Carlo method with silicon and carbon potentialsPetersen, Timothy; McCulloch, D G; O'Malley, B; Opletal, G.; Snook, I. K.; Yarovsky, I; Electron MicroscopeHRMC: Hybrid Reverse Monte Carlo method with silicon and carbon potentials, Computer Physics Communications, vol.178,(N/A),2008,pp 777-787
2009Influence of Field Evaporation on Radial Distribution Functions in Atom Probe TomographyBarton, Geoffrey; Haley, Daniel; Petersen, Timothy; Ringer, Simon; Chemical & Biomolecular Engineering; Key Centre - Microscopy; Electron Microscope; Electron MicroscopeInfluence of Field Evaporation on Radial Distribution Functions in Atom Probe Tomography, Philosophical Magazine, vol.89,(11),2009,pp 925-943
2011Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emitters(Loo Chin) Moy, Charles; Petersen, Timothy; Ranzi, Gianluca; Ringer, Simon; Civil Engineering; Australian Centre for Microscopy and Microanalysis (ACMM); Civil Engineering; Australian Centre for Microscopy and Microanalysis (ACMM)Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emitters, Ultramicroscopy, vol.111, 6, 2011,pp 397-404
2007Modeling of structure and porosity in amorphous silicon systems using Monte Carlo methodsPetersen, Timothy; McCulloch, D G; Opletal, G.; Snook, I. K.; Electron MicroscopeModeling of structure and porosity in amorphous silicon systems using Monte Carlo methods, Journal of Chemical Physics, vol.126,(N/A),2007,pp 214705-1-214705-7
2007Plasma biasing to control the growth conditions of diamond-like carbonLim, Sunnie; Petersen, Timothy; Anders, Andre; Keast, Vicki J.; Pasaja, Nitisak; Physics; Electron MicroscopePlasma biasing to control the growth conditions of diamond-like carbon, Surface and Coatings Technology, vol.201,(8),2007,pp 4628-4632
2008Plasmon resonances and electron phase shifts near Au nanospheresPetersen, Timothy; Anstis, G.R.; Bosman, Michel; Keast, Vicki J.; Electron MicroscopePlasmon resonances and electron phase shifts near Au nanospheres, Applied Physics Letters, vol.93,(DOI: 10.1063/1.2980505),2008,pp 101909-1-101909-3
2008Quantitative TEM-based phase retrieval of MgO nano-cubes using the transport of intensity equationPetersen, Timothy; Keast, Vicki J.; Paganin, David M.; Electron MicroscopeQuantitative TEM-based phase retrieval of MgO nano-cubes using the transport of intensity equation, Ultramicroscopy, vol.108,(N/A),2008,pp 805-815
2012RDFTools: A software tool for quantifying short-range ordering in amorphous materialsMitchell, David; Petersen, Timothy; Aerospace Mech & M'tronic Eng; Aerospace Mech & M'tronic EngRDFTools: A software tool for quantifying short-range ordering in amorphous materials, Microscopy Research and Technique, vol.75, 2, 2012,pp 153-163
2005Refinements in the Collection of Energy Filtered Diffraction Patterns from Disordered MaterialsPetersen, Timothy; Fat, How Ho; Lau, D.W.M; McBride, W E; McCulloch, D G; Snook, I. K.; Yarovsky, I; Electron MicroscopeRefinements in the Collection of Energy Filtered Diffraction Patterns from Disordered Materials, Microscopy and Microanalysis, vol.11,(Supplement 2),2005,pp 740-741
2012Short-range order in multicomponent materialsCeguerra, Anna; Powles, Rebecca; Ringer, Simon; Marceau, Ross; Moody, Michael; Petersen, Timothy; Aerospace Mech & M'tronic Eng; Engineering Faculty Admin; Aerospace Mech & M'tronic EngShort-range order in multicomponent materials, Acta Crystallographica Section A: Foundations of Crystallography, vol.A68, N/A, 2012,pp 547-560
2007TEM-based phase retrieval of p-n junction wafers using the transport of intensity equationPetersen, Timothy; Duvall, S; Johnson, K; Keast, Vicki J.; Electron MicroscopeTEM-based phase retrieval of p-n junction wafers using the transport of intensity equation, Philosophical Magazine, vol.87,(24),2007,pp 3565-3578