Browsing by Author Oikawa, T

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Issue DateTitleAuthor(s)Citation
2004Determination Of A Misfit Dislocation Complex In SiGe/Si Heterostructures By Image Deconvolution Technique In HREMZou, Jin; Chen, Haibin; He, W Z; Kawasaki, K; Li, F H; Oikawa, T; Wang, D; Electron MicroscopeDetermination Of A Misfit Dislocation Complex In SiGe/Si Heterostructures By Image Deconvolution Technique In HREM, Ultramicroscopy, vol.98,(2-4),2004,pp 259-264
2005Evaluation Of Electric Potential Distribution Near FEG-Emitter By ElectronholograpyOikawa, T; Park, Hyun Soon; Shindo, Daisuke; Tomita, Takeshi; Electron MicroscopeEvaluation Of Electric Potential Distribution Near FEG-Emitter By Electronholograpy, Microscopy and Microanalysis, vol.11,(Supplement 2),2005,pp 568-569