Browsing by Author Munroe, Paul

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Issue DateTitleAuthor(s)Citation
2002Contact-induced defect propagaton in ZnOSwain, Michael; Bradby, Jodie E.; Jagadish, C.; Kucheyev, S.O.; Munroe, Paul; Phillips, Mary L.; Williams, Jim S.; Dentistry FacultyContact-induced defect propagaton in ZnO, Applied Physics Letters, vol.80,(24),2002,pp 4537-4539
2007Giant pop-ins and amorphization in germanium during indentationSwain, Michael; Bradby, Jodie E.; Munroe, Paul; Oliver, David J.; Williams, Jim S.; Dentistry FacultyGiant pop-ins and amorphization in germanium during indentation, Journal of Applied Physics, vol.101,(4),2007,pp 043524-1-043524-9
2002Indentation-induced damage in GaN epilayersSwain, Michael; Bradby, Jodie E.; Kucheyev, S.O.; Li, G.; Munroe, Paul; Phillips, Mary L.; Williams, Jim S.; Wong-Leung, J; Dentistry FacultyIndentation-induced damage in GaN epilayers, Applied Physics Letters, vol.80,(3),2002,pp 383-385
2002Nanoindentation-induced deformation of GeSwain, Michael; Bradby, Jodie E.; Munroe, Paul; Williams, Jim S.; Wong-Leung, J; Dentistry FacultyNanoindentation-induced deformation of Ge, Applied Physics Letters, vol.80,(15),2002,pp 2651-2653
2004Phase Transformations Induced In Relaxed Amorphous Silicon By Indentation At Room TemperatureSwain, Michael; Bradby, Jodie E.; Haberl, B; Munroe, Paul; Williams, Jim S.; Dentistry FacultyPhase Transformations Induced In Relaxed Amorphous Silicon By Indentation At Room Temperature, APPLIED PHYSICS LETTERS (2005), vol.85,(23),2004,pp 5559-5561
2006Preparation of Site Specific Atom Probe Tips using Focused Ion Beam TechnologyCairney, Julie; Marceau, Ross; Ringer, Simon; Saxey, David; McGrouther, Damien; McKenzie, Warren; Munroe, Paul; Electron Microscope; Key Centre - Microscopy; Electron Microscope; Electron MicroscopePreparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology, Microscopy and Microanalysis, vol.12,(Supplement 2),2006,pp 1296-1297
2007Recent advances in FIB-based site-specific atom probe specimen preparation techniquesCairney, Julie; Ringer, Simon; Saxey, David; McKenzie, Warren; Munroe, Paul; Electron Microscope; Electron Microscope; Electron MicroscopeRecent advances in FIB-based site-specific atom probe specimen preparation techniques, Microscopy and Microanalysis, vol.13,(Suppl 2),2007,pp 1634 CD-1635 CD
2002Spherical indentation of compound semiconductorsSwain, Michael; Bradby, Jodie E.; Kucheyev, S.O.; Munroe, Paul; Williams, Jim S.; Wong-Leung, J; Dentistry FacultySpherical indentation of compound semiconductors, Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, vol.82,(10),2002,pp 1931-1939
2009Stress/Strain Induced Flux Pinning in Highly Dense MgB2 BulksRinger, Simon; Wang, Xuefeng (Steven); Zheng, Rongkun; Dou, S; Horvat, J; Kim, J. H.; Li, W. X.; Lu, L; Munroe, Paul; Poh, C K; Shi, D Q; Wang, J L; Zeng, R; Electron Microscope; Key Centre - Microscopy; Electron MicroscopeStress/Strain Induced Flux Pinning in Highly Dense MgB2 Bulks, IEEE Transactions on Applied Superconductivity, vol.19, 3,pp 2722-2725
2008Thickness-dependent phase transformation in nanoindented germaium thin filmsSwain, Michael; Bradby, J E; Munroe, Paul; Oliver, David J.; Williams, Jim S.; Dentistry FacultyThickness-dependent phase transformation in nanoindented germaium thin films, Nanotechnology, vol.19,(doi:10.1088/0957-4484/19/47/475709),2008,pp 475709-1-475709-8