Browsing by Author McGrouther, Damien

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Issue DateTitleAuthor(s)Citation
2007Atom probe specimen fabrication methods using a dual FIB/SEMCairney, Julie; Honma, Tomoyuki; Ringer, Simon; Saxey, David; McGrouther, Damien; Electron Microscope; Electron Microscope; Electron Microscope; Electron MicroscopeAtom probe specimen fabrication methods using a dual FIB/SEM, Ultramicroscopy, vol.107,(9),2007,pp 756-760
2006Preparation of Site Specific Atom Probe Tips using Focused Ion Beam TechnologyCairney, Julie; Marceau, Ross; Ringer, Simon; Saxey, David; McGrouther, Damien; McKenzie, Warren; Munroe, Paul; Electron Microscope; Key Centre - Microscopy; Electron Microscope; Electron MicroscopePreparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology, Microscopy and Microanalysis, vol.12,(Supplement 2),2006,pp 1296-1297
2007Site-specific specimen preparation for atom probe tomography of grain boundariesCairney, Julie; Ringer, Simon; Saxey, David; McGrouther, Damien; Electron Microscope; Electron Microscope; Electron MicroscopeSite-specific specimen preparation for atom probe tomography of grain boundaries, Physica B: Condensed Matter, vol.394,(2),2007,pp 267-269