Browsing by Author Geiser, Brian

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Issue DateTitleAuthor(s)Citation
2016Advanced volume reconstruction and data mining methods in atom probe tomographyCairney, Julie; Geiser, Brian; Lefebvre, Williams; Oberdorfer, Christian; Rajan, Krishna; Vurpillot, Francois; Aerospace Mech & Mtronic EngAdvanced volume reconstruction and data mining methods in atom probe tomography, MRS Bulletin, vol.41, 1, 2016,pp 46-51
2011Advances in the reconstruction of atom probe tomography dataGault, Baptiste; Moody, Michael; de Geuser, Frederic; Geiser, Brian; Haley, Daniel; Larson, David J.; Marquis, Emmanuelle A.; Australian Centre for Microscopy and Microanalysis (ACMM); Australian Centre for Microscopy and Microanalysis (ACMM)Advances in the reconstruction of atom probe tomography data, Ultramicroscopy, vol.111, N/A, 2011,pp 448-457
2013Electrostatic simulations of a local electrode atom probe: The dependence of tomographic reconstruction parameters on specimen and microscope geometryGault, Baptiste; Loi, Shyeh; Ringer, Simon; Geiser, Brian; Larson, David; Aerospace Mech & M'tronic Eng; Aerospace Mech & M'tronic Eng; Aerospace Mech & M'tronic EngElectrostatic simulations of a local electrode atom probe: The dependence of tomographic reconstruction parameters on specimen and microscope geometry, Ultramicroscopy, vol.132, N/A, 2013,pp 107-113
2011Field evaporation behavior in [0 0 1] FePt thin filmsMoody, Michael; Ringer, Simon; Geiser, Brian; Thompson, Gregory; Torres, Karen; Australian Centre for Microscopy and Microanalysis (ACMM); Australian Centre for Microscopy and Microanalysis (ACMM)Field evaporation behavior in [0 0 1] FePt thin films, Ultramicroscopy, vol.111, 6, 2011,pp 512-517