Browsing by Author Williams, Jim S.

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Showing results 1 to 18 of 18
Issue DateTitleAuthor(s)Citation
2002Blistering of H-implanted GaNZou, Jin; Jagadish, C.; Kucheyev, S.O.; Li, G.; Williams, Jim S.; Electron MicroscopeBlistering of H-implanted GaN, Journal of Applied Physics, vol.91,(6),2002,pp 3928-3930
2002Contact-induced defect propagaton in ZnOSwain, Michael; Bradby, Jodie E.; Jagadish, C.; Kucheyev, S.O.; Munroe, Paul; Phillips, Mary L.; Williams, Jim S.; Dentistry FacultyContact-induced defect propagaton in ZnO, Applied Physics Letters, vol.80,(24),2002,pp 4537-4539
2002Effect ion species on implantation-produced disorder in GaN at liquid nitrogen temperatureZou, Jin; Jagadish, C.; Kucheyev, S.O.; Li, G.; Titov, A.I.; Williams, Jim S.; Electron MicroscopeEffect ion species on implantation-produced disorder in GaN at liquid nitrogen temperature, Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, vol.190,(1-4),2002,pp 782-786
2007Eu-doped Boron Nitride Nanotubes as a Nanometer-Sized Visible-Light SourceLiu, Zongwen; Ringer, Simon; Chen, Hua; Chen, Ying; Li, Chi Pui; Liu, Y; Williams, Jim S.; Zhang, Hongzhou; Key Centre - Microscopy; Electron MicroscopeEu-doped Boron Nitride Nanotubes as a Nanometer-Sized Visible-Light Source, Advanced Materials, vol.19,(N/A),2007,pp 1845-1848
2007Giant pop-ins and amorphization in germanium during indentationSwain, Michael; Bradby, Jodie E.; Munroe, Paul; Oliver, David J.; Williams, Jim S.; Dentistry FacultyGiant pop-ins and amorphization in germanium during indentation, Journal of Applied Physics, vol.101,(4),2007,pp 043524-1-043524-9
2001High-dose ion implantation into GaNZou, Jin; Jagadish, C.; Kucheyev, S.O.; Li, Chi Pui; Williams, Jim S.; Electron MicroscopeHigh-dose ion implantation into GaN, Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, vol.175-177,(N/A),2001,pp 214-218
2003In situ electrical characterization of phase transformations in SI during indentationSwain, Michael; Bradby, Jodie E.; Williams, Jim S.; Dentistry FacultyIn situ electrical characterization of phase transformations in SI during indentation, Physical Review B- Condensed matter and materials physics, vol.67,(8),2003,pp 085205-1-085205-9
2002Indentation-induced damage in GaN epilayersSwain, Michael; Bradby, Jodie E.; Kucheyev, S.O.; Li, G.; Munroe, Paul; Phillips, Mary L.; Williams, Jim S.; Wong-Leung, J; Dentistry FacultyIndentation-induced damage in GaN epilayers, Applied Physics Letters, vol.80,(3),2002,pp 383-385
2002Ion-beam-produced damage & its stability in AIN filmsZou, Jin; Ferguson, I.T.; Guo, S.; Jagadish, C.; Kucheyev, S.O.; Manasreh, M.O.; Pophristic, M.; Williams, Jim S.; Electron MicroscopeIon-beam-produced damage & its stability in AIN films, Journal of Applied Physics, vol.92,(7),2002,pp 3554-3558
2003Ion-beam-produced structural defects in ZnOZou, Jin; Evans, Cheryl; Hamza, A. V.; Jagadish, C.; Kucheyev, S.O.; Nelson, A. J.; Williams, Jim S.; Electron MicroscopeIon-beam-produced structural defects in ZnO, Physical Review B, vol.67,(9),2003,pp 094115-1-094115-11
2002Large-quantity production of high-yield boron nitride nanotubesZou, Jin; Chen, Ying; Conway, M; Williams, Jim S.; Electron MicroscopeLarge-quantity production of high-yield boron nitride nanotubes, Journal of Materials Research, vol.17,(8),2002,pp 1896-1899
2002Mechanical deformation of single-crystal ZnOSwain, Michael; Bradby, J E; Jagadish, C.; Kucheyev, S.O.; Williams, Jim S.; Dentistry FacultyMechanical deformation of single-crystal ZnO, Applied Physics Letters, vol.80,(6),2002,pp 956-958
2002Nanoindentation-induced deformation of GeSwain, Michael; Bradby, Jodie E.; Munroe, Paul; Williams, Jim S.; Wong-Leung, J; Dentistry FacultyNanoindentation-induced deformation of Ge, Applied Physics Letters, vol.80,(15),2002,pp 2651-2653
2007On the cyclic indentation behavior of crystalline silicon with a sharp tipSwain, Michael; Fujisawa, Naoki; Williams, Jim S.; Dentistry FacultyOn the cyclic indentation behavior of crystalline silicon with a sharp tip, Journal of Materials Research, vol.22,(11),2007,pp 2992-2997
2004Phase Transformations Induced In Relaxed Amorphous Silicon By Indentation At Room TemperatureSwain, Michael; Bradby, Jodie E.; Haberl, B; Munroe, Paul; Williams, Jim S.; Dentistry FacultyPhase Transformations Induced In Relaxed Amorphous Silicon By Indentation At Room Temperature, APPLIED PHYSICS LETTERS (2005), vol.85,(23),2004,pp 5559-5561
2002Spherical indentation of compound semiconductorsSwain, Michael; Bradby, Jodie E.; Kucheyev, S.O.; Munroe, Paul; Williams, Jim S.; Wong-Leung, J; Dentistry FacultySpherical indentation of compound semiconductors, Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, vol.82,(10),2002,pp 1931-1939
2002Structural disorder in ion-implanted A1xGax_xNZou, Jin; Ferguson, I.T.; Guo, S.; Jagadish, C.; Kucheyev, S.O.; Li, G.; Manasreh, M.O.; Pophristic, M.; Williams, Jim S.; Electron MicroscopeStructural disorder in ion-implanted A1xGax_xN, Applied Physics Letters, vol.80,(5),2002,pp 787-789
2008Thickness-dependent phase transformation in nanoindented germaium thin filmsSwain, Michael; Bradby, J E; Munroe, Paul; Oliver, David J.; Williams, Jim S.; Dentistry FacultyThickness-dependent phase transformation in nanoindented germaium thin films, Nanotechnology, vol.19,(doi:10.1088/0957-4484/19/47/475709),2008,pp 475709-1-475709-8