Browsing by Author Kucheyev, S.O.

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Showing results 1 to 11 of 11
Issue DateTitleAuthor(s)Citation
2002Blistering of H-implanted GaNZou, Jin; Jagadish, C.; Kucheyev, S.O.; Li, G.; Williams, Jim S.; Electron MicroscopeBlistering of H-implanted GaN, Journal of Applied Physics, vol.91,(6),2002,pp 3928-3930
2002Contact-induced defect propagaton in ZnOSwain, Michael; Bradby, Jodie E.; Jagadish, C.; Kucheyev, S.O.; Munroe, Paul; Phillips, Mary L.; Williams, Jim S.; Dentistry FacultyContact-induced defect propagaton in ZnO, Applied Physics Letters, vol.80,(24),2002,pp 4537-4539
2004Dynamic Annealing In III-Nitrides Under Ion BombardmentZou, Jin; Jagadish, C.; Kucheyev, S.O.; Williams, Jim S; Electron MicroscopeDynamic Annealing In III-Nitrides Under Ion Bombardment, Journal of Applied Physics, vol.95,(6),2004,pp 3048-3054
2002Effect ion species on implantation-produced disorder in GaN at liquid nitrogen temperatureZou, Jin; Jagadish, C.; Kucheyev, S.O.; Li, G.; Titov, A.I.; Williams, Jim S.; Electron MicroscopeEffect ion species on implantation-produced disorder in GaN at liquid nitrogen temperature, Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, vol.190,(1-4),2002,pp 782-786
2001High-dose ion implantation into GaNZou, Jin; Jagadish, C.; Kucheyev, S.O.; Li, Chi Pui; Williams, Jim S.; Electron MicroscopeHigh-dose ion implantation into GaN, Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, vol.175-177,(N/A),2001,pp 214-218
2002Indentation-induced damage in GaN epilayersSwain, Michael; Bradby, Jodie E.; Kucheyev, S.O.; Li, G.; Munroe, Paul; Phillips, Mary L.; Williams, Jim S.; Wong-Leung, J; Dentistry FacultyIndentation-induced damage in GaN epilayers, Applied Physics Letters, vol.80,(3),2002,pp 383-385
2002Ion-beam-produced damage & its stability in AIN filmsZou, Jin; Ferguson, I.T.; Guo, S.; Jagadish, C.; Kucheyev, S.O.; Manasreh, M.O.; Pophristic, M.; Williams, Jim S.; Electron MicroscopeIon-beam-produced damage & its stability in AIN films, Journal of Applied Physics, vol.92,(7),2002,pp 3554-3558
2003Ion-beam-produced structural defects in ZnOZou, Jin; Evans, Cheryl; Hamza, A. V.; Jagadish, C.; Kucheyev, S.O.; Nelson, A. J.; Williams, Jim S.; Electron MicroscopeIon-beam-produced structural defects in ZnO, Physical Review B, vol.67,(9),2003,pp 094115-1-094115-11
2002Mechanical deformation of single-crystal ZnOSwain, Michael; Bradby, J E; Jagadish, C.; Kucheyev, S.O.; Williams, Jim S.; Dentistry FacultyMechanical deformation of single-crystal ZnO, Applied Physics Letters, vol.80,(6),2002,pp 956-958
2002Spherical indentation of compound semiconductorsSwain, Michael; Bradby, Jodie E.; Kucheyev, S.O.; Munroe, Paul; Williams, Jim S.; Wong-Leung, J; Dentistry FacultySpherical indentation of compound semiconductors, Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, vol.82,(10),2002,pp 1931-1939
2002Structural disorder in ion-implanted A1xGax_xNZou, Jin; Ferguson, I.T.; Guo, S.; Jagadish, C.; Kucheyev, S.O.; Li, G.; Manasreh, M.O.; Pophristic, M.; Williams, Jim S.; Electron MicroscopeStructural disorder in ion-implanted A1xGax_xN, Applied Physics Letters, vol.80,(5),2002,pp 787-789